ARM ARM7TDMI User Manual Page 222
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Debug in Depth
B-4 Copyright © 1994-2001. All rights reserved. ARM DDI 0029G
Figure B-1 ARM7TDMI core scan chain arrangements
Scan chain 0
Scan chain 0 enables access to the entire periphery of the ARM7TDMI core, including
the data bus. The scan chain functions enable inter-device testing (EXTEST) and serial
testing of the core (INTEST). The order of the scan chain, from search data in to out, is:
1. Data bus bits 0 to 31.
2. The control signals.
3. Address bus bits 31 to 0.
A[0] is scanned out first.
Scan chain 1
Scan chain 1 is a subset of scan chain 0. It provides serial access to the core data bus
D[31:0] and the BREAKPT signal.
There are 33 bits in this scan chain, the order from serial data in to serial data out, is:
1. Data bus bits 0 to 31.
2. The BREAKPT bit, the first to be shifted out.
Scan chain 2
Scan chain 2 enables access to the EmbeddedICE Logic registers. Refer to Test da ta
registers on page B-14 for details.
Embedded-ICE
Logic
ARM7TDM
(CPU core)
TAP controller
Scan chain 2
Scan chain 1
Scan chain 0
- ARM7TDMI 1
- Contents 5
- Chapter 3 Memory Interface 6
- Chapter 5 Debug Interface 6
- Appendix A Signal Description 7
- Appendix B Debug in Depth 7
- List of Tables 10
- List of Figures 13
- • Further reading on page xxi 17
- • Feedback on page xxii 17
- About this document 18
- Preface 19
- Further reading 21
- Feedback 22
- Chapter 1 23
- Introduction 23
- 1.1 About the ARM7TDMI core 24
- 1.2 Architecture 27
- Figure 1-3 Main processor 30
- <Oprnd2> 32
- #32bit_Imm 32
- <reglist> 32
- [Rn, #+/-12bit_Offset] 37
- [Rn, +/-Rm] 37
- Register 37
- [Rn, #+/-8bit_Offset] 39
- [Rn, #+/-(8bit_Offset*4)] 39
- Operand 2 40
- Chapter 2 47
- Programmer’s Model 47
- 31 24 23 16 15 8 7 0 50
- Word at address A 50
- 2.4 Data types 52
- 2.5 Operating modes 53
- 2.6 Registers 54
- MOV PC, R14 62
- MOVS PC, R14_svc 62
- MOVS PC, R14_und 62
- SUBS PC, R14_abt, #4 62
- SUBS PC, R14_fiq, #4 63
- SUBS PC, R14_irq, #4 63
- SUBS PC, R14_abt, #8 63
- SUBS PC,R14_fiq,#4 64
- SUBS PC,R14_irq,#4 65
- LDR Rn,[R14_abt,#-8] 65
- SUBS PC,R14_abt,#4 66
- SUBS PC,R14_abt,#8 66
- 0x00000004 67
- 0x00000008 67
- 0x0000000C 67
- 0x00000010 68
- 0x00000014 68
- 0x00000018 68
- 0x0000001C 68
- 2.9 Interrupt latencies 69
- 2.10 Reset 70
- Chapter 3 71
- 3.2 Bus interface signals 73
- 3.3 Bus cycle types 74
- Figure 3-4 Internal cycles 78
- Figure 3-5 Merged IS cycle 79
- 3.4 Addressing signals 81
- Table 3-5 nTRANS encoding 83
- 1 Privileged 83
- 3.5 Address timing 84
- 3.6 Data timed signals 87
- DOUT[31:0] 89
- XDATA[31:0] 89
- DIN[31:0] 89
- Figure 3-18 Memory access 95
- Figure 3-20 Data replication 98
- 3.7 Stretching access times 99
- Memory Interface 100
- 3.9 Privileged mode access 102
- Figure 3-22 Reset sequence 103
- Chapter 4 105
- Coprocessor Interface 105
- 4.1 About coprocessors 106
- Signal Direction Meaning 110
- Table 4-2 Handshaking signals 110
- ARM core 116
- Coprocessor 116
- 4.7 Undefined instructions 120
- 4.8 Privileged instructions 121
- Chapter 5 123
- Debug Interface 123
- 5.1 About the debug interface 124
- EmbeddedICE 127
- Main processor 127
- TAP controller 127
- 5.3 Debug interface signals 128
- Figure 5-3 Debug state entry 129
- MOV PC, #0 133
- 5.7 Disabling EmbeddedICE 137
- MRC CP14, 0, Rd, C0, C0, 0 139
- MCR CP14, 0, Rn, C1, C0, 0 139
- MRC CP14, 0, Rd, C1, C0, 0 139
- Chapter 6 143
- Instruction Cycle Timings 143
- SUB PC,R14,#4 to MOV PC,R14 146
- 6.3 Thumb branch with link 147
- 6.4 Branch and Exchange 148
- 6.5 Data operations 149
- Thumb state 150
- 6.7 Load register 154
- 6.8 Store register 156
- 6.9 Load multiple registers 157
- 6.10 Store multiple registers 159
- 6.11 Data swap 160
- 6.19 Unexecuted instructions 170
- Chapter 7 173
- AC and DC Parameters 173
- Figure 7-1 General timing 176
- 7.7 Output 3-state timing 182
- 7.10 Configuration pin timing 185
- 7.16 Breakpoint timing 192
- TCK to ECLK delay Maximum 193
- 7.20 Reset period timing 196
- In Table 7-23: 200
- 7.25 DC parameters 206
- Appendix A 207
- Signal Description 207
- A.1 Signal description 208
- A.1.3 Signals 209
- Appendix B 219
- Debug in Depth 219
- Scan chain 2 222
- B.1.2 TAP state machine 223
- B.3 Pullup resistors 225
- B.4 Instruction register 226
- B.5 Public instructions 227
- B.6 Test data registers 232
- Figure B-4 Input scan cell 235
- B.7 The ARM7TDMI core clocks 240
- Internal cycles 246
- 0 E0802000; ADD R2, R0, R0 247
- 1 E1826001; ORR R6, R2, R1 247
- MOV R0, R0 247
- SUB PC, PC, #28 247
- 0 E1A00000; MOV R0, R0 248
- 1 E1A00000; MOV R0, R0 248
- 0 EAFFFFF0; B -16 248
- 0 EAFFFFFA; B -6 249
- - (4+N+3S) 249
- - (3+N+3S) 249
- B.11 Scan chain cell data 251
- B.11.2 Scan chain 1 cells 255
- 31 D[30] Input/output 257
- 32 D[31] Input/output 257
- 33 BREAKPT Input 257
- Number Signal Type 257
- B.12 The watchpoint registers 258
- 0xFFFFFFFF 260
- B.13 Programming breakpoints 263
- 0xDEEEDEEE 264
- 0x00000000 264
- B.14 Programming watchpoints 265
- INTDIS DBGRQ DBGACK 266
- B.18 EmbeddedICE timing 272
- B.19 Programming Restriction 273
- Glossary 275
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